Δημοσιεύσεις σε Περιοδικά : [81]

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Collection's Items (Sorted by Submit Date in Descending order): 1 to 20 of 81
TitleAuthor(s)Issue date
Crack identification in beam structures using both mechanical impedance and eigenfrequency changesBamnios, George; Douka, Eleni; Trochidis, Athanasios; Τροχίδης, Αθανάσιος; Μπάνιος, Γιώργος; Δουκά, Ελένη14-Aug-2015
FPGAs and Wavelets on Circuit Testing Based on Current Signal MeasurementsHistov, Valentin; Hatzopoulos, Alkiviadis; Bamnios, George; Papakostas, Dimitrios; Manolakis, Dimitrios; Vassios, Vasilios; Pouros, Sotirios; Χατζόπουλος, Αλκιβιάδης; Μπάμνιος, Γεώργιος; Βάσσιος, Βασίλειος; Παπακώστας, Δημήτριος; Μανωλάκης, Δημήτριος17-Jul-2015
Methods for Testing Analog and Mixed-Signal CircuitsDimopoulos, Michael; Spyronasios, Alexios; Hatzopoulos, Alkiviadis; Tsatsoulis, N.; Papakostas, Dimitrios; Δημόπουλος, Μιχαήλ; Σπυρονάσιος, Αλέξιος; Χατζόπουλος, Αλκιβιάδης; Παπακώστας, Δημήτριος; Τσατσούλης, Ν.17-Jul-2015
Pattern Recognition Methods Application for Analog Circuit Fault DetectionDimopoulos, Michael; Goudelis, George; Stathis, Sotirios; Hatzopoulos, Alkiviadis; Papakostas, Dimitrios; Konstantinou, Dimitrios; Γουδέλης, Γεώργιος; Στάθιος, Σωτήριος; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης; Κωνσταντίνου, Δημήτριος; Δημόπουλος, Μιχαήλ17-Jul-2015
Selecting input current waveforms using a hardware testing implementation incorporated in FPGAsHatzopoulos, Alkiviadis; Pouros, Sotirios; Vassios, Vasilios; Papakostas, Dimitrios; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης; Πούρος, Σωτήριος; Βάσσιος, Βασίλειος17-Jul-2015
On the Design of an FPGA-based Mixed-Signal Circuits Testing SystemHatzopoulos, Alkiviadis; Vassios, Vasilios; Pouros, Sotirios; Papakostas, Dimitrios; Βάσσιος, Βασίλειος; Παπακώστας, Δημήτριος; Πούρος, Σωτήριος; Χατζόπουλος, Αλκιβιάδης17-Jul-2015
FPGA Based Mixed-Signal Circuit Novel Testing TechniquesPapakostas, Dimitrios; Vassios, Vasilios; Histov, Valentin; Pouros, Sotirios; Παπακώστας, Δημήτριος; Πούρος, Σωτήριος; Βάσσιος, Βασίλειος17-Jul-2015
Using the Light-impact Model for p-type and n-type poly-TFT in CircuitsPapakostas, Dimitrios; Picos, Rodrigo; Dimitriadis, Charalampos; Papadopoulos, Nikolaos; Παπακώστας, Δημήτριος; Παπαδόπουλος, Νικόλαος; Δημητριάδης, Χαράλαμπος17-Jul-2015
Support Vector Machine Methods Application for Analog & Mixed-Signal Circuit Fault DetectionSpyronasios, Alexios; Dimopoulos, Michael; Hatzopoulos, Alkiviadis; Papakostas, Dimitrios; Σπυρονάσιος, Αλέξιος; Παπακώστας, Δημήτριος; Δημόπουλος, Μιχαήλ; Χατζόπουλος, Αλκιβιάδης17-Jul-2015
Wavelet Analysis of Current Measurements for Mixed-Signal Circuit TestingHatzopoulos, Alkiviadis; Vassios, Vasilios; Dimopoulos, Michael; Papakostas, Dimitrios; Δημόπουλος, Μιχαήλ; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης; Βάσσιος, Βασίλειος17-Jul-2015
Input Stimulus Comparison using an Adaptive FPGA-based Testing SystemPapakostas, Dimitrios; Pouros, Sotirios; Vassios, Vasilios; Hatzopoulos, Alkiviadis; Χατζόπουλος, Αλκιβιάδης; Πούρος, Σωτήριος; Βάσσιος, Βασίλειος; Παπακώστας, Δημήτριος17-Jul-2015
FPGA-Based Mixed-Signal Circuits Testing System ImplementationVassios, Vasilios; Pouros, Sotirios; Papakostas, Dimitrios; Πούρος, Σωτήριος; Βάσσιος, Βασίλειος; Παπακώστας, Δημήτριος17-Jul-2015
Circuit Testing Method Based on WaveletsPapakostas, Dimitrios; Vassios, Vasilios; Pouros, Sotirios; Πούρος, Σωτήριος; Παπακώστας, Δημήτριος; Βάσσιος, Βασίλειος17-Jul-2015
Testing of an Optical Feedback Pixel Driver using Supply CurrentHatzopoulos, Alkiviadis; Papadopoulos, Nikolaos; Papakostas, Dimitrios; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης; Παπαδόπουλος, Νικόλαος17-Jul-2015
Analog and Mixed-Signal Testing by Wavelet Transformation of Power Supply Current MeasurementsKonstantinou, Dimitrios; Vassios, Vasilios; Hatzopoulos, Alkiviadis; Dimopoulos, Michael; Spyronasios, Alexios; Papakostas, Dimitrios; Χατζόπουλος, Αλκιβιάδης; Παπακώστας, Δημήτριος; Σπυρονάσιος, Αλέξιος; Βάσσιος, Βασίλειος; Δημόπουλος, Μιχαήλ; Κωνσταντίνου, Δημήτριος17-Jul-2015
Wavelet-based Mixed-Signal Testing using Supply Current MeasurementsSpyronasios, Alexios; Hatzopoulos, Alkiviadis; Konstantinou, Dimitrios; Papakostas, Dimitrios; Dimopoulos, Michael; Χατζόπουλος, Αλκιβιάδης; Παπακώστας, Δημήτριος; Σπυρονάσιος, Αλέξιος; Κωνσταντίνου, Δημήτριος; Δημόπουλος, Μιχαήλ17-Jul-2015
Power Supply Current Testing in the Production Line of Emergency Luminaire CircuitsDimopoulos, Michael; Papakostas, Dimitrios; Konstantinou, Dimitrios; Hatzopoulos, Alkiviadis; Spyronasios, Alexios; Χατζόπουλος, Αλκιβιάδης; Παπακώστας, Δημήτριος; Σπυρονάσιος, Αλέξιος; Κωνσταντίνου, Δημήτριος; Δημόπουλος, Μιχαήλ17-Jul-2015
A New Light-Impact Model for p-type and n-type poly-TFTPapadopoulos, Nikolaos; Dimitriadis, Charalampos; Papakostas, Dimitrios; Siskos, Stylianos; Picos, Rodrigo; Hatzopoulos, Alkiviadis; Σίσκος, Στυλιανός; Χατζόπουλος, Αλκιβιάδης; Παπακώστας, Δημήτριος; Δημητριάδης, Χαράλαμπος; Παπαδόπουλος, Νικόλαος17-Jul-2015
Simulation and Measurements for Testing an Emergency Luminaire CircuitPapakostas, Dimitrios; Hatzopoulos, Alkiviadis; Dimopoulos, Michael; Spyronasios, Alexios; Konstantinou, Dimitrios; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης; Κωνσταντίνου, Δημήτριος; Δημόπουλος, Μιχαήλ; Σπυρονάσιος, Αλέξιος17-Jul-2015
Testing an Emergency Luminaire Circuit using Fault Dictionary ApproachPapakostas, Dimitrios; Hatzopoulos, Alkiviadis; Dimopoulos, Michael; Konstantinou, Dimitrios; Spyronasios, Alexios; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης; Κωνσταντίνου, Δημήτριος; Δημόπουλος, Μιχαήλ; Σπυρονάσιος, Αλέξιος17-Jul-2015