Circuit Testing Method Based on Wavelets

Papakostas, Dimitrios/ Vassios, Vasilios/ Pouros, Sotirios/ Πούρος, Σωτήριος/ Παπακώστας, Δημήτριος/ Βάσσιος, Βασίλειος

Institution and School/Department of submitter: ΤΕΙ Θεσσαλονίκης
Issue Date: Dec-2014
Publisher: SDIWC
Citation: Papakostas, D., Vassios, V. and Pouros, S. (2014). Circuit Testing Method Based on Wavelets. In: International Conference In Information Security and Digital Forensics: conference proceedings, Thessaloniki, 2014. Thessaloniki: SDIWC, pp.81-84.
International Conference In Information Security and Digital Forensics, Thessaloniki, 2014
Abstract: The paper presents the comparison of waveforms for the input stimulus of a circuit under test, using a testing system incorporated in an FPGA, relying on a method based on wavelet transformation of the supply current or load current waveforms. The method differentiates due to the incorporation of different signal inputs according to the needs of the tester and the specifications of the circuit. This is a distinctive and effective method that offers a single– point test measurement solution and may easily be adapted to test various other analog and mixed-signal systems. Experimental results, derived from measurement comparisons, are presented showing the effectiveness of the proposed testing scheme.
Description: Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών, 2014
ISBN: 978-1-941968-03-1
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Appears in Collections:Δημοσιεύσεις σε Περιοδικά

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