Selecting input current waveforms using a hardware testing implementation incorporated in FPGAs

Hatzopoulos, Alkiviadis/ Pouros, Sotirios/ Vassios, Vasilios/ Papakostas, Dimitrios/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης/ Πούρος, Σωτήριος/ Βάσσιος, Βασίλειος

Institution and School/Department of submitter: ΤΕΙ Θεσσαλονίκης
Keywords: Wavelet transforms;Load (electric);Field programmable gate arrays;Fault diagnosis;Circuit testing
Issue Date: May-2014
Citation: Papakostas, D., Hatzopoulos, A., Vassios, V. and Pouros, S. (2014). Selecting Input Current Waveforms Using a Hardware Testing Implementation Incorporated in FPGAs. In: International Conference on Microelectronics: conference proceedings, Belgrade, 2014. Belgrade: IEEE, pp.379-382.
International Conference on Microelectronics, Belgrade, 2014
Abstract: The paper presents the comparison of waveforms for the input stimulus of a circuit under test, using a testing system incorporated in an FPGA, relying on a method based on wavelet transformation of the supply current or load current waveforms. The method differentiates due to the incorporation of different signal inputs according to the needs of the tester and the specifications of the circuit. This is a distinctive and effective method that offers a single-point test measurement solution and may easily be adapted to test various other analog and mixed-signal systems. Experimental results are presented showing the effectiveness of the proposed testing scheme.
Description: Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών, 2014
ISBN: 978-1-4799-5295-3
Other Identifiers: 10.1109/MIEL.2014.6842169
Appears in Collections:Δημοσιεύσεις σε Περιοδικά

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