Browsing by Author Χατζόπουλος, Αλκιβιάδης

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TitleAuthor(s)Issue date
Automated Electronic Measuring SystemΠαπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης; Papakostas, Dimitrios; Hatzopoulos, Alkiviadis7-Jul-2015
Circuit Implementation of a Supply Current Spectrum Test MethodSpyronasios, Alexios; Hatzopoulos, Alkiviadis; Kostantinou, Dimitrios; Dimopoulos, Michael; Papakostas, Dimitrios; Δημόπουλος, Μιχαήλ; Κωνσταντίνου, Δημήτριος; Χατζόπουλος, Αλκιβιάδης; Παπακώστας, Δημήτριος; Σπυρονάσιος, Αλέξιος6-Jul-2015
Comparison of RF Inductor Performance Evaluation MethodsDrakaki, Maria; Siskos, Stylianos; Papakostas, Dimitrios; Hatzopoulos, Alkiviadis; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης; Σίσκος, Στυλιανός; Δακάκη, Μαρία16-Jul-2015
Correlation-based comparison of analog signatures for identification and fault diagnosisHatzopoulos, Alkiviadis; Papakostas, Dimitrios; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης3-Jul-2015
Current Spectrum Measurements for Analog Fault DiagnosisIoannou, A.; Papakostas, Dimitrios; Hatzopoulos, Alkiviadis; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης; Ιωάννου, Α.7-Jul-2015
Current-based Testing of Optical Feedback Pixel DriverPapadopoulos, Nikolaos; Hatzopoulos, Alkiviadis; Papakostas, Dimitrios; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης; Παπαδόπουλος, Νικόλαος3-Jul-2015
Design and Development of a Versatile Testing System for Analog and Mixed-Signal CircuitsSpyronasios, Alexios; Konstantinidis, Evdokimos; Dimopoulos, Michael; Papakostas, Dimitrios; Hatzopoulos, Alkiviadis; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης; Σπυρονάσιος, Αλέξιος; Κωνσταντινίδης, Ευδόκιμος; Δημόπουλος, Μιχαήλ16-Jul-2015
Detection of Time Delay Related Faults using Fourier Phase Components of Power Supply CurrentPapakostas, Dimitrios; Hatzopoulos, Alkiviadis; Χατζόπουλος, Αλκιβιάδης; Παπακώστας, Δημήτριος3-Jul-2015
Estimating the influence of light on the performance of polycrystalline thin-film transistors at the sub-threshold regionHatzopoulos, Alkiviadis; Papakostas, Dimitrios; Papadopoulos, Nikolaos; Dimitriadis, Charalampos; Siskos, Stylianos; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης; Παπαδόπουλος, Νικόλαος; Σίσκος, Στυλιανός; Δημητριάδης, Χαράλαμπος15-Jul-2015
Estimation of Circuit Output Measurements including Statistically Depended ParametersPapakostas, Dimitrios; Hatzopoulos, Alkiviadis; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης3-Jul-2015
Estimation of Statistical Variables for Analog Circuit Parameter EvaluationPapakostas, Dimitrios; Hatzopoulos, Alkiviadis; Palouktsoglou, G.; Χατζόπουλος, Αλκιβιάδης; Παπακώστας, Δημήτριος; Παλουκτσόγκλου, Γ.7-Jul-2015
Estimation of Statistical Variables for analogue fault detectability evaluationPapakostas, Dimitrios; Hatzopoulos, Alkiviadis; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης3-Jul-2015
Fault Detectability of Double Analogue Measurements using Probabilistic AnalysisHatzopoulos, Alkiviadis; Papakostas, Dimitrios; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης15-Jul-2015
Fault detection in linear bipolar ICs: comparative results between power supply current and output voltage measurementsHatzopoulos, Alkiviadis; Papakostas, Dimitrios; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης7-Jul-2015
Fault Identification in Analog Circuits using Current Spectrum MeasurementsIoannou, A.; Hatzopoulos, Alkiviadis; Papakostas, Dimitrios; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης; Ιωάννου, Α.7-Jul-2015
FPGAs and Wavelets on Circuit Testing Based on Current Signal MeasurementsHistov, Valentin; Hatzopoulos, Alkiviadis; Bamnios, George; Papakostas, Dimitrios; Manolakis, Dimitrios; Vassios, Vasilios; Pouros, Sotirios; Χατζόπουλος, Αλκιβιάδης; Μπάμνιος, Γεώργιος; Βάσσιος, Βασίλειος; Παπακώστας, Δημήτριος; Μανωλάκης, Δημήτριος17-Jul-2015
Impact Of Circuit Parameter Derivative Calculation on Estimation of Statistical Variables for Analog Fault Detectability EvaluationPapakostas, Dimitrios; Hatzopoulos, Alkiviadis; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης16-Jul-2015
Impact of Parameter Covariance on Fault Detectability Estimation of Analog and Mixed-Mode CircuitsHatzopoulos, Alkiviadis; Papakostas, Dimitrios; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης3-Jul-2015
Improved Analogue Fault Coverage Estimation using Probabilistic AnalysisChatzopoulos, Alkiviadis; Papakostas, Dimitrios; Χατζόπουλος, Αλκιβιάδης; Παπακώστας, Δημήτριος3-Jul-2015
Input Stimulus Comparison using an Adaptive FPGA-based Testing SystemPapakostas, Dimitrios; Pouros, Sotirios; Vassios, Vasilios; Hatzopoulos, Alkiviadis; Χατζόπουλος, Αλκιβιάδης; Πούρος, Σωτήριος; Βάσσιος, Βασίλειος; Παπακώστας, Δημήτριος17-Jul-2015