Fault Detectability of Double Analogue Measurements using Probabilistic Analysis

Hatzopoulos, Alkiviadis/ Papakostas, Dimitrios/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης

Institution and School/Department of submitter: ΤΕΙ Θεσσαλονίκης
Issue Date: Oct-2005
Citation: International Conference on Technology and Automation, Thessaloniki, 2005
Papakostas, D.and Hatzopoulos, A. (2005). Fault Detectability of Double Analogue Measurements using Probabilistic Analysis. In: International Conference on Technology and Automation: conference proceedings, Thessaloniki, 2005. Thessaloniki: Alexander Technological Educational Institute of Thessaloniki, pp.297-300.
Abstract: Statistical multi-parameter circuit simulation is used in this work, in order to estimate the fault detection probability in cases where double analogue measurements are utilized. Theoretical analysis for the estimation of the detectability is given, based on conditional probability calculations. The proposed technique can also be applied for test measurement selection. Simulation results from the application of the method on an analogue filter circuit are given, showing a sufficient improvement over the detectability achieved by single measurements.
Description: Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,2005
Other Identifiers: http://icta05.teithe.gr/papers/54.pdf
Appears in Collections:Δημοσιεύσεις σε Περιοδικά

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