Estimation of Statistical Variables for analogue fault detectability evaluation

Papakostas, Dimitrios/ Hatzopoulos, Alkiviadis/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης

Institution and School/Department of submitter: ΤΕΙ Θεσσαλονίκης
Keywords: Circuit simulation;Αnalogue integrated circuits;Monte Carlo methods;Integrated circuit testing;Integrated circuit measurement;Fault diagnosis
Issue Date: Dec-1999
Publisher: Institution of Education and Technology
Citation: Journal: Circuits, Devices and Systems, IEE Proceedings, vol.146, no.6, 1999
Papakostas, D. and Chatzopoulos, A. (1999). Estimation of Statistical Variables for analogue fault detectability evaluation. Circuits, Devices and Systems, IEE Proceedings [online]. 146(6), pp.350-354. Διαθέσιμο σε: [Ανακτήθηκε 19 Ιουλίου 2015]
Abstract: An efficient method for estimating the mean value and standard deviation of output measurements is introduced. It takes into account statistical variations of component values and gives accurate and realistic results with less computational time compared with the Monte Carlo technique. A method for the estimation of fault detectability of output measurements in a simulation-before-test approach is proposed. Results from four different circuits show the effectiveness of the methods in selecting the measurement with the highest detectability among a given set and also their application for input stimulus selection.
Description: Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,1999
ISSN: 1350-2409
Other Identifiers: 10.1049/ip-cds:19990581
Appears in Collections:Δημοσιεύσεις σε Περιοδικά

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