Current-based Testing of Optical Feedback Pixel Driver

Papadopoulos, Nikolaos/ Hatzopoulos, Alkiviadis/ Papakostas, Dimitrios/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης/ Παπαδόπουλος, Νικόλαος

Institution and School/Department of submitter: ΤΕΙ Θεσσαλονίκης
Keywords: Thin film transistors;Pulse width modulation;Organic light emitting diodes;Optical feedback;Driver circuits;Circuit testing
Issue Date: Apr-2010
Publisher: IEEE
Citation: Papakostas, D., Papadopoulos, N. and Hatzopoulos, A. (2010). Current-based Testing of Optical Feedback Pixel Driver. Journal of Display Technology [online]. 6(4), pp.150-157. Διαθέσιμο σε: [Ανακτήθηκε 19 Ιουλίου 2015]
Journal: Journal of Display Technology, vol.6, no.4, 2010
Abstract: A testing scheme of an optical feedback pixel driver is proposed, discussed and simulated by HSPICE. A basic characteristic of the specific circuit is that the gray scales of the pixel are created by pulse width modulation. So, the integral of the output I pixel current (which is proportional to I oled) has to be measured or calculated and used for testing. The testing procedure that is proposed enables the detection and identification of common processing defects up to 96%, as verified from simulation results. Although I pixel current is tend to be very low, the measuring system used, using special instrumentation ICs, is successfully simulated and verified by HSPICE.
Description: Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,2010
ISSN: 1551-319X
Other Identifiers: 10.1109/JDT.2009.2039986
Appears in Collections:Δημοσιεύσεις σε Περιοδικά

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