Current-based Testing of Optical Feedback Pixel Driver
Papadopoulos, Nikolaos/ Hatzopoulos, Alkiviadis/ Papakostas, Dimitrios/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης/ Παπαδόπουλος, Νικόλαος
|Institution and School/Department of submitter:||ΤΕΙ Θεσσαλονίκης|
|Keywords:||Thin film transistors;Pulse width modulation;Organic light emitting diodes;Optical feedback;Driver circuits;Circuit testing|
|Citation:||Papakostas, D., Papadopoulos, N. and Hatzopoulos, A. (2010). Current-based Testing of Optical Feedback Pixel Driver. Journal of Display Technology [online]. 6(4), pp.150-157. Διαθέσιμο σε: http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=5438918&url=http%3A%2F%2Fieeexplore.ieee.org%2Fiel5%2F9425%2F5431077%2F05438918.pdf%3Farnumber%3D5438918 [Ανακτήθηκε 19 Ιουλίου 2015]|
Journal: Journal of Display Technology, vol.6, no.4, 2010
|Abstract:||A testing scheme of an optical feedback pixel driver is proposed, discussed and simulated by HSPICE. A basic characteristic of the specific circuit is that the gray scales of the pixel are created by pulse width modulation. So, the integral of the output I pixel current (which is proportional to I oled) has to be measured or calculated and used for testing. The testing procedure that is proposed enables the detection and identification of common processing defects up to 96%, as verified from simulation results. Although I pixel current is tend to be very low, the measuring system used, using special instrumentation ICs, is successfully simulated and verified by HSPICE.|
|Description:||Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,2010|
|Appears in Collections:||Δημοσιεύσεις σε Περιοδικά|
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