Estimation of Circuit Output Measurements including Statistically Depended Parameters
Papakostas, Dimitrios/ Hatzopoulos, Alkiviadis/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης
| Institution and School/Department of submitter: | ΤΕΙ Θεσσαλονίκης |
| Keywords: | Statistical circuit analysis;Analogue circuits;Monte-Carlo technique |
| Issue Date: | Mar-2003 |
| Publisher: | Wiley Online Library |
| Citation: | Journal: International Journal of Circuit Theory and Applications, vol.31, no.2, 2003 Papakostas, D. and Hatzopoulos, A. (2003). Estimation of Circuit Output Measurements including Statistically Depended Parameters. International Journal of Circuit Theory and Applications [online]. 31(2), pp.219-228. Διαθέσιμο σε: http://onlinelibrary.wiley.com/doi/10.1002/cta.218/pdf [Ανακτήθηκε 19 Ιουλίου 2015] |
| Abstract: | An extension to the method for estimating statistical variables of output measurements, in order to take into account the statistical variations and matching dependencies between circuit parameters, is studied. The enhanced method results in sufficient estimations, while additional circuit simulations are needed. Comparative results from the application of the method and of the Monte-Carlo analysis on three analogue circuits are presented to show the effectiveness of the extended method. |
| Description: | Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,2003 |
| URI: | http://195.251.240.227/jspui/handle/123456789/10042 |
| ISSN: | 1097-007X |
| Other Identifiers: | 10.1002/cta.218 |
| Appears in Collections: | Δημοσιεύσεις σε Περιοδικά |
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