Skip navigation
Home
Browse
Communities
& Collections
Browse Items by:
Issue Date
Author
Title
Subject
Item Type
Advanced Search
Useful
Links
Information
Help
Sign on to:
My DSpace
Receive email
updates
Edit Profile
Saved Searches
Favorites
Eureka! Institutional Repository
Eureka! Institutional Repository
Σχολή Τεχνολογικών Εφαρμογών (ΣΤΕΦ)
Τμήμα Ηλεκτρονικών Μηχανικών
Δημοσιεύσεις ΕΠ
Δημοσιεύσεις σε Περιοδικά
Saved Searches
Save this search
Go!
Discover
Author
28
Papakostas, Dimitrios
27
Hatzopoulos, Alkiviadis
12
Bamnios, George
9
Dimopoulos, Michael
9
Papadopoulos, Nikolaos
8
Spyronasios, Alexios
8
Trochidis, Athanasios
7
Konstantinou, Dimitrios
7
Siskos, Stylianos
6
Dimitriadis, Charalampos
.
next >
Subject
5
Fault diagnosis
4
Circuit testing
4
Mixed analogue-digital integrated...
3
Circuit simulation
3
Integrated circuit testing
2
Analogue integrated circuits
2
Analogue-digital conversion
2
Noise control--Greece--Equipment ...
2
Noise mapping
2
Noise measurement
.
next >
Date issued
5
2009
8
2008
9
2007
5
2006
4
2005
3
2004
4
2003
3
2002
5
2001
2
2000
.
next >
Search
Search:
All of DSpace
Σχολή Τεχνολογικών Εφαρμογών (ΣΤΕΦ)
Τμήμα Ηλεκτρονικών Μηχανικών
Δημοσιεύσεις ΕΠ
Δημοσιεύσεις σε Περιοδικά
for
Search only items with full text availability
Current filters:
Title
Author
Subject
Date Issued
Item Type
Date
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Title
Author
Subject
Date Issued
Item Type
Date
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Clear current filters
or
Add more filters
Title
Author
Subject
Date Issued
Item Type
Date
Equals
Contains
ID
Not Equals
Not Contains
Not ID
View Option
Results/Page
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
Sort items by
Relevance
Title
Issue Date
In order
Ascending
Descending
Authors/record
All
1
5
10
15
20
25
30
35
40
45
50
Results 31-40 of 48 (Search time: 0.003 seconds).
previous
1
2
3
4
5
next
Noise Barriers dependance on topography
A Light-impact Model for p-type and n-type poly-Si TFTs
Identification of Cracks in single and doublecracked beams using mechanical impedance
Design and evaluation of Novel Barriers
A Fault Diagnosis Expert System Structure with Knowledge Retrieving Capability from Waveforms
Estimating the influence of light on the performance of polycrystalline thin-film transistors at the sub-threshold region
Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region
New Optical Feedback Pixel driver circuit and its Simulation in SPICE
Analogue Measurements Fault Detectability using Probabilistic Analysis
Pattern Recognition Methods Application for Analog Circuit Fault Detection