Fault Detectability of Double Analogue Measurements using Probabilistic Analysis
Hatzopoulos, Alkiviadis/ Papakostas, Dimitrios/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Hatzopoulos, Alkiviadis | el |
| dc.contributor.author | Papakostas, Dimitrios | el |
| dc.contributor.other | Παπακώστας, Δημήτριος | el |
| dc.contributor.other | Χατζόπουλος, Αλκιβιάδης | el |
| dc.date.accessioned | 2015-07-15T12:43:45Z | el |
| dc.date.accessioned | 2018-02-28T16:16:46Z | - |
| dc.date.available | 2015-07-15T12:43:45Z | el |
| dc.date.available | 2018-02-28T16:16:46Z | - |
| dc.date.issued | 2005-10 | el |
| dc.identifier | http://icta05.teithe.gr/papers/54.pdf | el |
| dc.identifier.citation | International Conference on Technology and Automation, Thessaloniki, 2005 | el |
| dc.identifier.citation | Papakostas, D.and Hatzopoulos, A. (2005). Fault Detectability of Double Analogue Measurements using Probabilistic Analysis. In: International Conference on Technology and Automation: conference proceedings, Thessaloniki, 2005. Thessaloniki: Alexander Technological Educational Institute of Thessaloniki, pp.297-300. | el |
| dc.identifier.uri | http://195.251.240.227/jspui/handle/123456789/10064 | - |
| dc.description | Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,2005 | el |
| dc.description.abstract | Statistical multi-parameter circuit simulation is used in this work, in order to estimate the fault detection probability in cases where double analogue measurements are utilized. Theoretical analysis for the estimation of the detectability is given, based on conditional probability calculations. The proposed technique can also be applied for test measurement selection. Simulation results from the application of the method on an analogue filter circuit are given, showing a sufficient improvement over the detectability achieved by single measurements. | el |
| dc.language.iso | en | el |
| dc.relation.ispartof | 5th International Conference on Technology and Automation | el |
| dc.rights | This item is probably protected by Copyright Legislation | el |
| dc.rights | Το τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσία | el |
| dc.title | Fault Detectability of Double Analogue Measurements using Probabilistic Analysis | el |
| dc.type | Conference article | el |
| heal.type | other | el |
| heal.type.en | Other | en |
| heal.dateAvailable | 2018-02-28T16:17:46Z | - |
| heal.language | el | el |
| heal.access | free | el |
| heal.recordProvider | ΤΕΙ Θεσσαλονίκης | el |
| heal.fullTextAvailability | false | el |
| heal.type.el | Άλλο | el |
| Appears in Collections: | Δημοσιεύσεις σε Περιοδικά | |
Files in This Item:
There are no files associated with this item.
Please use this identifier to cite or link to this item:
This item is a favorite for 0 people.
http://195.251.240.227/jspui/handle/123456789/10064
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
