Estimation of Circuit Output Measurements including Statistically Depended Parameters

Papakostas, Dimitrios/ Hatzopoulos, Alkiviadis/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης


Institution and School/Department of submitter: ΤΕΙ Θεσσαλονίκης
Keywords: Statistical circuit analysis;Analogue circuits;Monte-Carlo technique
Issue Date: Mar-2003
Publisher: Wiley Online Library
Citation: Journal: International Journal of Circuit Theory and Applications, vol.31, no.2, 2003
Papakostas, D. and Hatzopoulos, A. (2003). Estimation of Circuit Output Measurements including Statistically Depended Parameters. International Journal of Circuit Theory and Applications [online]. 31(2), pp.219-228. Διαθέσιμο σε: http://onlinelibrary.wiley.com/doi/10.1002/cta.218/pdf [Ανακτήθηκε 19 Ιουλίου 2015]
Abstract: An extension to the method for estimating statistical variables of output measurements, in order to take into account the statistical variations and matching dependencies between circuit parameters, is studied. The enhanced method results in sufficient estimations, while additional circuit simulations are needed. Comparative results from the application of the method and of the Monte-Carlo analysis on three analogue circuits are presented to show the effectiveness of the extended method.
Description: Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,2003
URI: http://195.251.240.227/jspui/handle/123456789/10042
ISSN: 1097-007X
Other Identifiers: 10.1002/cta.218
Item type: other
Submission Date: 2018-02-28T16:17:43Z
Item language: el
Item access scheme: free
Institution and School/Department of submitter: ΤΕΙ Θεσσαλονίκης
Appears in Collections:Δημοσιεύσεις σε Περιοδικά

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