Multiple Parametric Circuit Analysis Tool for Detectability Estimation

Konstantinou, Dimitrios/ Spyronasios, Alexios/ Dimopoulos, Michael/ Hatzopoulos, Alkiviadis/ Papakostas, Dimitrios/ Κωνσταντίνου, Δημήτριος/ Σπυρονάσιος, Αλέξιος/ Δημόπουλος, Μιχαήλ/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης

Institution and School/Department of submitter: ΤΕΙ Θεσσαλονίκης
Keywords: Circuit analysis computing;Circuit testing;Software tools;Graphical user interfaces
Issue Date: Dec-2007
Citation: Papakostas, D., Hatzopoulos, A., Dimopoulos, M., Spyronasios, A. and Konstantinou, D. (2007). Multiple Parametric Circuit Analysis Tool for Detectability Estimation. In: International Conference On Electronics, Circuits, and Systems: conference proceedings, Marrakech, 2007. [S.l.]: IEEE, pp.1111-1114.
International Conference On Electronics, Circuits, and Systems, Marrakech, 2007
Abstract: In this paper a software tool is presented which is capable of producing testability metrics for analog and mixed-signal circuits. These metrics are obtained by performing probabilistic analysis techniques. The presented tool acts as a shell utilizing the power of state of the art external schematic and simulation programs and offers to the user a graphical interface for circuit design and test. This interface is transparent to the user elaborately hiding all the complex task manipulations. Preliminary results are presented showing the effectiveness of the proposed scheme.
ISBN: 978-1-4244-1377-5
Other Identifiers: 10.1109/ICECS.2007.4511189
Appears in Collections:Δημοσιεύσεις σε Περιοδικά

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