Microcontroller-based Production-Line Testing
Hatzopoulos, Alkiviadis/ Konstantinidis, Evdokimos/ Dimopoulos, Michael/ Spyronasios, Alexios/ Papakostas, Dimitrios/ Χατζόπουλος, Αλκιβιάδης/ Κωνσταντινίδης, Ευδόκιμος/ Δημόπουλος, Μιχαήλ/ Παπακώστας, Δημήτριος/ Σπυρονάσιος, Αλέξιος
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Hatzopoulos, Alkiviadis | el |
| dc.contributor.author | Konstantinidis, Evdokimos | el |
| dc.contributor.author | Dimopoulos, Michael | el |
| dc.contributor.author | Spyronasios, Alexios | el |
| dc.contributor.author | Papakostas, Dimitrios | el |
| dc.contributor.other | Χατζόπουλος, Αλκιβιάδης | el |
| dc.contributor.other | Κωνσταντινίδης, Ευδόκιμος | el |
| dc.contributor.other | Δημόπουλος, Μιχαήλ | el |
| dc.contributor.other | Παπακώστας, Δημήτριος | el |
| dc.contributor.other | Σπυρονάσιος, Αλέξιος | el |
| dc.date.accessioned | 2015-07-16T14:17:46Z | el |
| dc.date.accessioned | 2018-02-28T16:16:47Z | - |
| dc.date.available | 2015-07-16T14:17:46Z | el |
| dc.date.available | 2018-02-28T16:16:47Z | - |
| dc.date.issued | 2007-11 | el |
| dc.identifier.citation | Conference on Design of Circuits and Integrated Systems, Sevilla, 2007 | el |
| dc.identifier.citation | Papakostas, D., Hatzopoulos, A., Dimopoulos, M., Konstantinidis, E. and Spyronasios, A. (2007). Microcontroller-based Production-Line Testing. In: Conference on Design of Circuits and Integrated Systems: conference proceedings, Seville, 2007. Seville: DCIS, pp.553-557. | el |
| dc.identifier.uri | http://195.251.240.227/jspui/handle/123456789/10075 | - |
| dc.description | Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών, 2007 | el |
| dc.language.iso | en | el |
| dc.relation.ispartof | 22th Conference on Design of Circuits and Integrated Systems | el |
| dc.rights | This item is probably protected by Copyright Legislation | el |
| dc.rights | Το τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσία | el |
| dc.title | Microcontroller-based Production-Line Testing | el |
| dc.type | Conference article | el |
| heal.type | other | el |
| heal.type.en | Other | en |
| heal.dateAvailable | 2018-02-28T16:17:47Z | - |
| heal.language | el | el |
| heal.access | free | el |
| heal.recordProvider | ΤΕΙ Θεσσαλονίκης | el |
| heal.fullTextAvailability | false | el |
| heal.type.el | Άλλο | el |
| Appears in Collections: | Δημοσιεύσεις σε Περιοδικά | |
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http://195.251.240.227/jspui/handle/123456789/10075
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