Analog Fault Detectability based on Statistical Circuit Analysis

Papakostas, Dimitrios/ Hatzopoulos, Alkiviadis/ Kosmidis, V./ Χατζόπουλος, Αλκιβιάδης/ Παπακώστας, Δημήτριος/ Κοσμίδης, Β.

Institution and School/Department of submitter: ΤΕΙ Θεσσαλονίκης
Keywords: Statistical analysis;Monte Carlo methods;Analogue integrated circuits;Automatic testing;Circuit analysis computing;Fault diagnosis;Integrated circuit testing;Probability
Issue Date: Oct-1996
Publisher: IEEE
Citation: Papakostas, D., Hatzopoulos, A. and Kosmidis, V. (1996). Analog fault detectability based on statistical circuit analysis. IEEE International Conference on Electronics, Circuits, and Systems [online]. vol.5, pp.1076-1079. Διαθέσιμο σε: [Ανακτήθηκε 19 Ιουλίου 2015]
International Conference on Electronics Circuits and Systems, Rhodes, 1996
Abstract: Statistical multi-parameter circuit simulation is used in this work, in order to estimate the fault detection probability of various analog measurements. Since the method is a simulation-before-test approach, its computational complexity can be considered acceptable utilizing modern computer systems. Parameter deviations and multiple Monte-Carlo analysis are properly handled by a shell program, named MPCAP, which uses the SPICE simulator as a kernel. Theoretical analysis for the calculation of the probabilities is given, along with simulation results from an analog filter example.
Description: Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,1996
ISSN: 0-7803-3650-X
Other Identifiers: 10.1109/ICECS.1996.584607
Appears in Collections:Δημοσιεύσεις σε Περιοδικά

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