Fault detection in linear bipolar ICs: comparative results between power supply current and output voltage measurements

Hatzopoulos, Alkiviadis/ Papakostas, Dimitrios/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης


Institution and School/Department of submitter: ΤΕΙ Θεσσαλονίκης
Keywords: Integrated circuit measurement;Integrated circuit testing;Bipolar analogue integrated circuits;Fault diagnosis;Operational amplifiers
Issue Date: May-1994
Publisher: IEEE
Citation: Papakostas, D. and Hatzopoulos, A. (1994). Fault detection in linear bipolar ICs: comparative results between power supply current and output voltage measurements. IEEE International Symposium on Circuits and Systems [online]. 5, pp.61-64. Διαθέσιμο σε: http://ieeexplore.ieee.org/xpl/login.jsptp=&arnumber=409300&url=http%3A%2F%2Fieeexplore.ieee.org%2Fiel2%2F3224%2F9173%2F00409300.pdf%3Farnumber%3D409300 [Ανακτήθηκε 19 Ιουλίου 2015]
International Symposium on Circuits and Systems, London, 1994
Abstract: Fault detection in linear bipolar integrated circuits using power supply current measurements is investigated. The most prevalent, catastrophic and parametric faults, have been modelled for the representative (741 type) op amp. The circuit is simulated in both linear and non-linear operations. Comparative results between power supply current and output voltage measurements are given, showing the improvement in fault coverage by the use of the current sensing method
Description: Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,1994
URI: http://195.251.240.227/jspui/handle/123456789/10040
ISSN: 0-7803-1915-X
Other Identifiers: 10.1109/ISCAS.1994.409300
Item type: other
Submission Date: 2018-02-28T16:17:43Z
Item language: el
Item access scheme: free
Institution and School/Department of submitter: ΤΕΙ Θεσσαλονίκης
Appears in Collections:Δημοσιεύσεις σε Περιοδικά

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