Fault detection in linear bipolar ICs: comparative results between power supply current and output voltage measurements
Hatzopoulos, Alkiviadis/ Papakostas, Dimitrios/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Hatzopoulos, Alkiviadis | el |
| dc.contributor.author | Papakostas, Dimitrios | el |
| dc.contributor.other | Παπακώστας, Δημήτριος | el |
| dc.contributor.other | Χατζόπουλος, Αλκιβιάδης | el |
| dc.date.accessioned | 2015-07-07T08:50:46Z | el |
| dc.date.accessioned | 2018-02-28T16:16:43Z | - |
| dc.date.available | 2015-07-07T08:50:46Z | el |
| dc.date.available | 2018-02-28T16:16:43Z | - |
| dc.date.issued | 1994-05 | el |
| dc.identifier | 10.1109/ISCAS.1994.409300 | el |
| dc.identifier.citation | Papakostas, D. and Hatzopoulos, A. (1994). Fault detection in linear bipolar ICs: comparative results between power supply current and output voltage measurements. IEEE International Symposium on Circuits and Systems [online]. 5, pp.61-64. Διαθέσιμο σε: http://ieeexplore.ieee.org/xpl/login.jsptp=&arnumber=409300&url=http%3A%2F%2Fieeexplore.ieee.org%2Fiel2%2F3224%2F9173%2F00409300.pdf%3Farnumber%3D409300 [Ανακτήθηκε 19 Ιουλίου 2015] | el |
| dc.identifier.citation | International Symposium on Circuits and Systems, London, 1994 | el |
| dc.identifier.issn | 0-7803-1915-X | el |
| dc.identifier.uri | http://195.251.240.227/jspui/handle/123456789/10040 | - |
| dc.description | Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,1994 | el |
| dc.description.abstract | Fault detection in linear bipolar integrated circuits using power supply current measurements is investigated. The most prevalent, catastrophic and parametric faults, have been modelled for the representative (741 type) op amp. The circuit is simulated in both linear and non-linear operations. Comparative results between power supply current and output voltage measurements are given, showing the improvement in fault coverage by the use of the current sensing method | el |
| dc.language.iso | en | el |
| dc.publisher | IEEE | el |
| dc.relation.isbasedon | 1994 International Symposium on Circuits and Systems | el |
| dc.rights | Το τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσία | el |
| dc.rights | This item is probably protected by Copyright Legislation | el |
| dc.source.uri | http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=3224 | el |
| dc.subject | Integrated circuit measurement | el |
| dc.subject | Integrated circuit testing | el |
| dc.subject | Bipolar analogue integrated circuits | el |
| dc.subject | Fault diagnosis | el |
| dc.subject | Operational amplifiers | el |
| dc.title | Fault detection in linear bipolar ICs: comparative results between power supply current and output voltage measurements | el |
| dc.type | Conference article | el |
| heal.type | other | el |
| heal.type.en | Other | en |
| heal.dateAvailable | 2018-02-28T16:17:43Z | - |
| heal.language | el | el |
| heal.access | free | el |
| heal.recordProvider | ΤΕΙ Θεσσαλονίκης | el |
| heal.fullTextAvailability | false | el |
| heal.type.el | Άλλο | el |
| Appears in Collections: | Δημοσιεύσεις σε Περιοδικά | |
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