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Supply current testing in linear bipolar ICs

Papakostas, Dimitrios/ Hatzopoulos, Alkiviadis/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης

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dc.contributor.authorPapakostas, Dimitriosel
dc.contributor.authorHatzopoulos, Alkiviadisel
dc.contributor.otherΠαπακώστας, Δημήτριοςel
dc.contributor.otherΧατζόπουλος, Αλκιβιάδηςel
dc.date.accessioned2015-07-03T09:25:53Zel
dc.date.accessioned2018-02-28T16:16:43Z-
dc.date.available2015-07-03T09:25:53Zel
dc.date.available2018-02-28T16:16:43Z-
dc.date.issued1994-01-20el
dc.identifier10.1049/el:19940088el
dc.identifier.citationJournal: Electronics Letters, vol.30, no.2, 1994el
dc.identifier.citationPapakostas, D. and Hatzopoulos, A. (1994). Supply current testing in linear bipolar ICs. Electronics Letters [online]. 30(2), pp.128-130. Διαθέσιμο σε: http://digital-library.theiet.org/content/journals/10.1049/el_19940088 [Ανακτήθηκε 19 Ιουλίου 2015]el
dc.identifier.issn1350-911Xel
dc.identifier.issn0013-5194el
dc.identifier.urihttp://195.251.240.227/jspui/handle/123456789/10039-
dc.descriptionΔημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,1994el
dc.description.abstractFault detection in linear bipolar integrated circuits using power supply current measurements is investigated. The most prevalent, catastrophic and parametric faults, have been modelled for a representative (741 type) opamp. The circuit is simulated under both linear and nonlinear operation. Comparative results between power supply current and output voltage measurements are given, showing the improvement in fault coverage by the use of the current sensing method.el
dc.language.isoenel
dc.publisherInstitution of Education and Technologyel
dc.rightsThis item is probably protected by Copyright Legislationel
dc.rightsΤο τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσίαel
dc.source.urihttp://digital-library.theiet.org/content/journals/elel
dc.subjectBipolar integrated circuitsel
dc.subjectElectric current measurementel
dc.subjectFault locationel
dc.subjectLinear integrated circuitsel
dc.subjectIntegrated circuit testingel
dc.subjectOperational amplifiersel
dc.titleSupply current testing in linear bipolar ICsel
dc.typeArticleel
heal.typeotherel
heal.type.enOtheren
heal.dateAvailable2018-02-28T16:17:43Z-
heal.languageelel
heal.accessfreeel
heal.recordProviderΤΕΙ Θεσσαλονίκηςel
heal.fullTextAvailabilityfalseel
heal.type.elΆλλοel
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