Fault Identification in Analog Circuits using Current Spectrum Measurements

Ioannou, A./ Hatzopoulos, Alkiviadis/ Papakostas, Dimitrios/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης/ Ιωάννου, Α.


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dc.contributor.authorIoannou, A.el
dc.contributor.authorHatzopoulos, Alkiviadisel
dc.contributor.authorPapakostas, Dimitriosel
dc.contributor.otherΠαπακώστας, Δημήτριοςel
dc.contributor.otherΧατζόπουλος, Αλκιβιάδηςel
dc.contributor.otherΙωάννου, Α.el
dc.date.accessioned2015-07-07T09:24:43Zel
dc.date.accessioned2018-02-28T16:16:41Z-
dc.date.available2015-07-07T09:24:43Zel
dc.date.available2018-02-28T16:16:41Z-
dc.date.issued1995-09el
dc.identifier.citationInternational Symposium on Theoretical Electrical Engineering, Thessaloniki, 1995el
dc.identifier.citationPapakostas, D., Hatzopoulos, A., and Ioannou, A. (1995). Fault Identification in Analog Circuits using Current Spectrum Measurements. In: International Symposium on Theoretical Electrical Engineering: conference proceedings, Thessaloniki, 1995. Thessaloniki: Aristotle University of Thessaloniki, pp.40-43.el
dc.identifier.urihttp://195.251.240.227/jspui/handle/123456789/10027-
dc.descriptionΔημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,1995el
dc.language.isoenel
dc.relation.ispartof8th International Symposium on Theoretical Electrical Engineeringel
dc.rightsThis item is probably protected by Copyright Legislationel
dc.rightsΤο τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσίαel
dc.titleFault Identification in Analog Circuits using Current Spectrum Measurementsel
dc.typeConference articleel
heal.typeotherel
heal.type.enOtheren
heal.dateAvailable2018-02-28T16:17:41Z-
heal.languageelel
heal.accessfreeel
heal.recordProviderΤΕΙ Θεσσαλονίκηςel
heal.fullTextAvailabilityfalseel
heal.type.elΆλλοel
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