Impact Of Circuit Parameter Derivative Calculation on Estimation of Statistical Variables for Analog Fault Detectability Evaluation

Papakostas, Dimitrios/ Hatzopoulos, Alkiviadis/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης


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dc.contributor.authorPapakostas, Dimitriosel
dc.contributor.authorHatzopoulos, Alkiviadisel
dc.contributor.otherΠαπακώστας, Δημήτριοςel
dc.contributor.otherΧατζόπουλος, Αλκιβιάδηςel
dc.date.accessioned2015-07-16T10:41:20Zel
dc.date.accessioned2018-02-28T16:16:47Z-
dc.date.available2015-07-16T10:41:20Zel
dc.date.available2018-02-28T16:16:47Z-
dc.date.issued2007-06el
dc.identifier.citationPapakostas, D. and Hatzopoulos, A. (2007). Impact Of Circuit Parameter Derivative Calculation on Estimation of Statistical Variables for Analog Fault Detectability Evaluation. In: International Mixed Signal Testing Workshop: conference proceedings, Portugal, 2007. [S.l.]: IEEE, pp.37-41.el
dc.identifier.citationInternational Mixed Signal Testing Workshop, Portugal, 2007el
dc.identifier.urihttp://195.251.240.227/jspui/handle/123456789/10069-
dc.descriptionΔημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών, 2007el
dc.language.isoenel
dc.relation.ispartof13th IEEE International Mixed Signal Testing Workshopel
dc.rightsThis item is probably protected by Copyright Legislationel
dc.rightsΤο τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσίαel
dc.titleImpact Of Circuit Parameter Derivative Calculation on Estimation of Statistical Variables for Analog Fault Detectability Evaluationel
dc.typeConference articleel
heal.typeotherel
heal.type.enOtheren
heal.dateAvailable2018-02-28T16:17:47Z-
heal.languageelel
heal.accessfreeel
heal.recordProviderΤΕΙ Θεσσαλονίκηςel
heal.fullTextAvailabilityfalseel
heal.type.elΆλλοel
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