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A Unified Procedure for Fault Detection of Analogue and Mixed-mode Circuits Using Magnitude and Phase Components of the Power Supply Current Spectrum
Detection of Time Delay Related Faults using Fourier Phase Components of Power Supply Current
Analogue Fault Detectability Comparison Between Power Supply Current and Output Voltage Magnitude and Phase Spectrum Components
Fault detection in linear bipolar ICs: comparative results between power supply current and output voltage measurements
Supply current testing in linear bipolar ICs