Wavelet-based Mixed-Signal Testing using Supply Current Measurements

Spyronasios, Alexios/ Hatzopoulos, Alkiviadis/ Konstantinou, Dimitrios/ Papakostas, Dimitrios/ Dimopoulos, Michael/ Χατζόπουλος, Αλκιβιάδης/ Παπακώστας, Δημήτριος/ Σπυρονάσιος, Αλέξιος/ Κωνσταντίνου, Δημήτριος/ Δημόπουλος, Μιχαήλ


Institution and School/Department of submitter: ΤΕΙ Θεσσαλονίκης
Issue Date: Nov-2008
Citation: Papakostas, D., Hatzopoulos, A., Spyronasios, A., Dimopoulos, M. and Konstantinou,D. (2008). Wavelet-based Mixed-Signal Testing using Supply Current Measurements. In: Conference on Design of Circuits and Integrated Systems: conference proceedings, Grenoble, 2008. [S.l.: s.n.], pp.5-8.
Conference on Design of Circuits and Integrated Systems, Grenoble, 2008
Description: Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών, 2008
URI: http://195.251.240.227/jspui/handle/123456789/10088
Item type: other
Submission Date: 2018-02-28T16:17:49Z
Item language: el
Item access scheme: free
Institution and School/Department of submitter: ΤΕΙ Θεσσαλονίκης
Appears in Collections:Δημοσιεύσεις σε Περιοδικά

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