Input Stimulus Comparison using an Adaptive FPGA-based Testing System

Abstract

In this paper the comparison of input stimulus signals using an adaptive FPGA-based testing system based on a method utilising wavelet transformation of the current waveforms is presented. The testing scheme is innovative because it offers the ability of applying different input stimulus signals with respect to the requirements of the examined circuit. Moreover, the method used is simple, offers a single-point test measurement solution and may easily be adapted to test various other analog and mixed-signal systems. Experimental results are presented showing the effectiveness of the proposed testing scheme.