Input Stimulus Comparison using an Adaptive FPGA-based Testing System

Papakostas, Dimitrios/ Pouros, Sotirios/ Vassios, Vasilios/ Hatzopoulos, Alkiviadis/ Χατζόπουλος, Αλκιβιάδης/ Πούρος, Σωτήριος/ Βάσσιος, Βασίλειος/ Παπακώστας, Δημήτριος

Institution and School/Department of submitter: ΤΕΙ Θεσσαλονίκης
Keywords: Fault diagnosis;Field programmable gate arrays;Wavelet transforms
Issue Date: Jun-2014
Publisher: IEEE
Citation: International Symposium on Circuits and Systems, Melbourne, 2014
Papakostas, D., Hatzopoulos, A., Vassios, V. and Pouros, S. (2014). Input Stimulus Comparison using an Adaptive FPGA-based Testing System. In: International Symposium on Circuits and Systems: conference proceedings, Melbourne, 2014. [S.l.]: IEEE, pp.277-280.
Abstract: In this paper the comparison of input stimulus signals using an adaptive FPGA-based testing system based on a method utilising wavelet transformation of the current waveforms is presented. The testing scheme is innovative because it offers the ability of applying different input stimulus signals with respect to the requirements of the examined circuit. Moreover, the method used is simple, offers a single-point test measurement solution and may easily be adapted to test various other analog and mixed-signal systems. Experimental results are presented showing the effectiveness of the proposed testing scheme.
Description: Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών, 2014
ISBN: 978-1-4799-3431-7
ISSN: 978-1-4799-3431-7
Other Identifiers: 10.1109/ISCAS.2014.6865119
Item type: other
Submission Date: 2018-02-28T16:17:48Z
Item language: el
Item access scheme: free
Institution and School/Department of submitter: ΤΕΙ Θεσσαλονίκης
Appears in Collections:Δημοσιεύσεις σε Περιοδικά

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