Input Stimulus Comparison using an Adaptive FPGA-based Testing System

Papakostas, Dimitrios/ Pouros, Sotirios/ Vassios, Vasilios/ Hatzopoulos, Alkiviadis/ Χατζόπουλος, Αλκιβιάδης/ Πούρος, Σωτήριος/ Βάσσιος, Βασίλειος/ Παπακώστας, Δημήτριος

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dc.contributor.authorPapakostas, Dimitriosel
dc.contributor.authorPouros, Sotiriosel
dc.contributor.authorVassios, Vasiliosel
dc.contributor.authorHatzopoulos, Alkiviadisel
dc.contributor.otherΧατζόπουλος, Αλκιβιάδηςel
dc.contributor.otherΠούρος, Σωτήριοςel
dc.contributor.otherΒάσσιος, Βασίλειοςel
dc.contributor.otherΠαπακώστας, Δημήτριοςel
dc.identifier.citationInternational Symposium on Circuits and Systems, Melbourne, 2014el
dc.identifier.citationPapakostas, D., Hatzopoulos, A., Vassios, V. and Pouros, S. (2014). Input Stimulus Comparison using an Adaptive FPGA-based Testing System. In: International Symposium on Circuits and Systems: conference proceedings, Melbourne, 2014. [S.l.]: IEEE, pp.277-280.el
dc.descriptionΔημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών, 2014el
dc.description.abstractIn this paper the comparison of input stimulus signals using an adaptive FPGA-based testing system based on a method utilising wavelet transformation of the current waveforms is presented. The testing scheme is innovative because it offers the ability of applying different input stimulus signals with respect to the requirements of the examined circuit. Moreover, the method used is simple, offers a single-point test measurement solution and may easily be adapted to test various other analog and mixed-signal systems. Experimental results are presented showing the effectiveness of the proposed testing scheme.el
dc.relation.ispartof2014 IEEE International Symposium on Circuits and Systemsel
dc.rightsThis item is probably protected by Copyright Legislationel
dc.rightsΤο τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσίαel
dc.subjectFault diagnosisel
dc.subjectField programmable gate arraysel
dc.subjectWavelet transformsel
dc.titleInput Stimulus Comparison using an Adaptive FPGA-based Testing Systemel
dc.typeConference articleel
heal.recordProviderΤΕΙ Θεσσαλονίκηςel
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