Testing of Analog and Mixed-Signal Circuits by using Supply Current Measurements

Papakostas, Dimitrios/ Hatzopoulos, Alkiviadis/ Iatrou, E./ Katsaras, C./ Παπακώστας, Δημήτριος/ Ιατρού, Ε./ Χατζόπουλος, Αλκιβιάδης/ Κατσάρας, Χ.

Institution and School/Department of submitter: ΤΕΙ Θεσσαλονίκης
Keywords: Electric current measurement;Mixed analogue-digital integrated circuits;Analogue integrated circuits;Fault diagnosis;Integrated circuit testing
Issue Date: Oct-1998
Publisher: Institution of Education and Technology
Citation: Journal: Circuits, Devices and Systems, IEE Proceedings, vol.145, no.5, 1998
Papakostas, D., Chatzopoulos, A., Iatrou, E. and Katsaras, C. (1998). Testing of Analog and Mixed-Signal Circuits by using Supply Current Measurements. Circuits, Devices and Systems, IEE Proceedings [online]. 45(5), pp.319-324. Διαθέσιμο σε: http://www.ieeeexplore.ws/xpl/articleDetails.jsp?&arnumber=739674 [Ανακτήθηκε 19 Ιουλίου 2015]
Abstract: A complete (hardware and software) system has been designed and implemented, which can measure the supply current (IPS) of analogue and mixed-mode circuits and detect or diagnose faults, based on RMS and spectrum calculations of the IPS and the corresponding fault dictionary. The system is applied to testing and diagnosis of various analogue and mixed-signal circuits, showing very encouraging results.
Description: Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,1998
ISSN: 1359-7000
Other Identifiers: 10.1049/ip-cds:19982118
Appears in Collections:Δημοσιεύσεις σε Περιοδικά

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