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Detection of Time Delay Related Faults using Fourier Phase Components of Power Supply Current

Papakostas, Dimitrios/ Hatzopoulos, Alkiviadis/ Χατζόπουλος, Αλκιβιάδης/ Παπακώστας, Δημήτριος

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dc.contributor.authorPapakostas, Dimitriosel
dc.contributor.authorHatzopoulos, Alkiviadisel
dc.contributor.otherΧατζόπουλος, Αλκιβιάδηςel
dc.contributor.otherΠαπακώστας, Δημήτριοςel
dc.date.accessioned2015-07-03T10:11:51Zel
dc.date.accessioned2018-02-28T16:16:43Z-
dc.date.available2015-07-03T10:11:51Zel
dc.date.available2018-02-28T16:16:43Z-
dc.date.issued2004-01el
dc.identifier10.1049/el:20040070el
dc.identifier.citationJournal: Electronics Letters, vol.40, no.1, 2004el
dc.identifier.citationPapakostas, D. and Chatzopoulos, A. (2004). Detection of Time Delay Related Faults using Fourier Phase Components of Power Supply Current. Electronics Letters [online]. 40(1), pp.7-8. Διαθέσιμο σε: http://digital-library.theiet.org/content/journals/10.1049/el_20040070 [Ανακτήθηκε 19 Ιουλίου 2015]el
dc.identifier.issn1350-911Xel
dc.identifier.issn0013-5194el
dc.identifier.urihttp://195.251.240.227/jspui/handle/123456789/10043-
dc.descriptionΔημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,2004el
dc.description.abstractA new method using power supply current spectrum phase components for fault detection in analogue and mixed mode circuits is presented. A procedure is introduced, a discrimination factor is defined and its value is adjusted for efficient application of the method. Representative results from an operational amplifier and a flash analogue-to-digital converter circuit are given, showing the effectiveness of the proposed method.el
dc.language.isoenel
dc.publisherInstitution of Education and Technologyel
dc.rightsΤο τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσίαel
dc.rightsThis item is probably protected by Copyright Legislationel
dc.source.urihttp://digital-library.theiet.org/content/journals/elel
dc.subjectFault diagnosisel
dc.subjectMixed analogue-digital integrated circuitsel
dc.subjectAnalogue integrated circuitsel
dc.subjectOperational amplifiersel
dc.subjectCircuit simulationel
dc.subjectIntegrated circuit testingel
dc.subjectMonte Carlo methodsel
dc.subjectFourier analysisel
dc.subjectSpectral analysisel
dc.subjectAnalogue-digital conversionel
dc.subjectDelaysel
dc.titleDetection of Time Delay Related Faults using Fourier Phase Components of Power Supply Currentel
dc.typeArticleel
heal.typeotherel
heal.type.enOtheren
heal.dateAvailable2018-02-28T16:17:43Z-
heal.languageelel
heal.accessfreeel
heal.recordProviderΤΕΙ Θεσσαλονίκηςel
heal.fullTextAvailabilityfalseel
heal.type.elΆλλοel
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