Supply current testing in linear bipolar ICs

Papakostas, Dimitrios/ Hatzopoulos, Alkiviadis/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης

Institution and School/Department of submitter: ΤΕΙ Θεσσαλονίκης
Keywords: Bipolar integrated circuits;Electric current measurement;Fault location;Linear integrated circuits;Integrated circuit testing;Operational amplifiers
Issue Date: 20-Jan-1994
Publisher: Institution of Education and Technology
Citation: Journal: Electronics Letters, vol.30, no.2, 1994
Papakostas, D. and Hatzopoulos, A. (1994). Supply current testing in linear bipolar ICs. Electronics Letters [online]. 30(2), pp.128-130. Διαθέσιμο σε: [Ανακτήθηκε 19 Ιουλίου 2015]
Abstract: Fault detection in linear bipolar integrated circuits using power supply current measurements is investigated. The most prevalent, catastrophic and parametric faults, have been modelled for a representative (741 type) opamp. The circuit is simulated under both linear and nonlinear operation. Comparative results between power supply current and output voltage measurements are given, showing the improvement in fault coverage by the use of the current sensing method.
Description: Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,1994
ISSN: 1350-911X
Other Identifiers: 10.1049/el:19940088
Item type: other
Submission Date: 2018-02-28T16:17:43Z
Item language: el
Item access scheme: free
Institution and School/Department of submitter: ΤΕΙ Θεσσαλονίκης
Appears in Collections:Δημοσιεύσεις σε Περιοδικά

Files in This Item:
There are no files associated with this item.

 Please use this identifier to cite or link to this item:
  This item is a favorite for 0 people.

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.