Wavelet Analysis of Current Measurements for Mixed-Signal Circuit Testing

Hatzopoulos, Alkiviadis/ Vassios, Vasilios/ Dimopoulos, Michael/ Papakostas, Dimitrios/ Δημόπουλος, Μιχαήλ/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης/ Βάσσιος, Βασίλειος


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dc.contributor.authorHatzopoulos, Alkiviadisel
dc.contributor.authorVassios, Vasiliosel
dc.contributor.authorDimopoulos, Michaelel
dc.contributor.authorPapakostas, Dimitriosel
dc.contributor.otherΔημόπουλος, Μιχαήλel
dc.contributor.otherΠαπακώστας, Δημήτριοςel
dc.contributor.otherΧατζόπουλος, Αλκιβιάδηςel
dc.contributor.otherΒάσσιος, Βασίλειοςel
dc.date.accessioned2015-07-17T16:12:10Zel
dc.date.accessioned2018-02-28T16:16:48Z-
dc.date.available2015-07-17T16:12:10Zel
dc.date.available2018-02-28T16:16:48Z-
dc.date.issued2010-06el
dc.identifier10.1109/ISCAS.2010.5537999el
dc.identifier.citationPapakostas, D., Hatzopoulos, A., Dimopoulos, M. and Vassios, V. (2010). Wavelet Analysis of Current Measurements for Mixed-Signal Circuit Testing. In: International Symposium on Circuits and Systems: conference proceedings, Paris, 2010. Paris: IEEE, pp.1923-1926.el
dc.identifier.citationInternational Symposium on Circuits and Systems, Paris, 2010el
dc.identifier.urihttp://195.251.240.227/jspui/handle/123456789/10083-
dc.descriptionΔημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών, 2010el
dc.description.abstractIn this paper a test method based on the wavelet transformation of the measured supply current (IPS) and load current (IL) waveforms is presented. In the wavelet analysis, the test metrics used are utilizing the initial three decomposition levels of the measured signal. Experimental comparative results between the proposed method, a test method based on the RMS value of IPS, a test method utilizing the harmonic magnitude components of the IPS spectrum and a method based on the wavelet transformation of the IPS are presented showing the effectiveness of the proposed testing scheme.el
dc.language.isoenel
dc.publisherIEEEel
dc.relation.ispartofInternational Symposium on Circuits and Systemsel
dc.rightsThis item is probably protected by Copyright Legislationel
dc.rightsΤο τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσίαel
dc.subjectMixed analogue-digital integrated circuitsel
dc.subjectIntegrated circuit testingel
dc.subjectElectric current measurementel
dc.subjectWavelet transformsel
dc.titleWavelet Analysis of Current Measurements for Mixed-Signal Circuit Testingel
dc.typeConference articleel
heal.typeotherel
heal.type.enOtheren
heal.dateAvailable2018-02-28T16:17:48Z-
heal.languageelel
heal.accessfreeel
heal.recordProviderΤΕΙ Θεσσαλονίκηςel
heal.fullTextAvailabilityfalseel
heal.type.elΆλλοel
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